There has been growing concern regarding particulate matter (PM) pollution and its affects on health. For effective preventative measures, source appointment of PM is extremely important. Therefore, indication of PM elemental concentration is also necessary in addition to PM mass concentration. PX–375 enables automatic sampling, continuous online PM quantitative and qualitative analysis and rapid air pollution source appointment.
Features
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Lowest Detection Limit (Example) (2σ) (ng⁄m³)
∗ LDL (σ) is half of the LDL (2σ)
Specifications: | |
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Product name | Continuous Particulate Monitor with X–ray Fluorescence |
Model | PX–375 |
Measured object | Particulate matter (PM10, PM2.5, TSP) |
Measurement content | Particulate mass concentration and element concentration |
Common: | |
Flow rate | 16.7L⁄min |
Sampling pump | Linear drive system, externally installed |
Filter tape | None–woven PTFE fabric filter |
Spot tape interval | 20⁄25⁄50⁄100mm selectable |
Filter tape replacement interval | Approx. 1 month (In case of 100mm spot interval) |
Ambient operation temperature | 10°C∼30°C |
Relative humidity | 0∼80% RH noncondensing |
Altitude | 1000m or less |
Power supply | AC100V∼240V ±10%, 50⁄60Hz±1% |
Power consumption | Approx. 400VA |
External dimension | 430mm(W)×550mm(D)×285mm(H) (without sampling pipe and measurement head) |
Weight | Approx. 40kg (Without sampling pipe and measurement head) |
Data output | CSV file (Average PM mass and elemental concentration) |
External connection | EthernetTM, USB, RS–232C∗ (option) |
Mass analyzer unit | |
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Measurement method | Beta–ray attenuation |
PM10 | US EPA Louvered PM10 Inlet |
PM2.5 | BGI VSCCTM Cyclone |
TSP | TSP Inlet |
Measurement range | 0∼200⁄500⁄1000μg⁄m³ |
Repeatability | ±2% (against reference foil value) |
Span drift | ±3% (24hours) |
Lowest detection limit (2σ) | ±2μg⁄m3 (24hours) |
Sampling and measurement cycle | 0.5⁄1⁄2⁄3⁄4⁄6⁄8⁄12⁄24 hours |
Element analyzer unit | |
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Measurement method | Energy dispersive X–ray spectroscopy |
Detectable elements | See Table 2 "Detectable Elements". Standard parameter is S, Ti, Cr, Mn, Ni, Cu, Zn, Pb, Al, Si, K, Ca, V, Fe, As. |
Primary X–ray filter | Automatic switching for light metals⁄heavy metals |
Tube voltage | Automatic switching for 15kV⁄50kV |
Detector | SDD (Silicon Drift Detector) |
Sample image | CMOS camera |
Lowest detection limit (2σ) | Recommended EPA Method IO 3.3 See Table 1 "Lowest Detection Limit (Example)" |
Measurement range | Up to measurement time |
Analysis time | 1000s (16.6 min) as standard 100 ⁄ 200 ⁄ 500 ⁄ 1000 ⁄ 2000 ⁄ 5000 ⁄ 10000s selectable |
Calibration material for X–ray intensity for standard parameter | NIST SRM 2783, other materials (option) |
Safety functions for X–ray | Internal lock system Key switch X–ray indication light |
For more details please contact us here or visit HORIBA Process & Environmental